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High-Speed Modular Component Testsystems
for discrete Semiconductors including Handler Control.
Our testsystems offer the highest precision, testspeed and versatility on the marketplace due to embedded processors and Realtime Operating Systems.
Stimulus Measurement Units (SMUs)
| Stimulus: | µV to 8000 V nA to 20 A |
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| Measurement: | nV to 8000 V pA to 20 A pF to nF |
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| Time Control: | µsec. Resolution | |
| Adaption: | up to 20 Component Pins with FORCE / SENSE / GUARD Serial Interface for Prober / Handler / Sorting |
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| Support: | Easy to use Graphical User Interface Software VISA Drivers Comprehensive on-Site Support at Design / Integration of Production Machines |
Don’t hesitate to consult us for data sheets.